A Comprehensive Evaluation of Functional Programs for Power-Aware Test. - Aymen Touati; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri-Sanial; Arnaud Virazel; Paolo Bernardi (NATW, 2014)

Exploring the impact of functional test programs re-used for power-aware testing. - Aymen Touati; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Arnaud Virazel; Paolo Bernardi; Matteo Sonza Reorda (DATE, 2015)

Scan-chain intra-cell defects grading. - Aymen Touati; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Arnaud Virazel; Paolo Bernardi; Matteo Sonza Reorda (DTIS, 2015)

An effective approach for functional test programs compaction. - Aymen Touati; Alberto Bosio; Patrick Girard 001; Arnaud Virazel; Paolo Bernardi; Matteo Sonza Reorda (DDECS, 2016)

Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study. - Aymen Touati; Alberto Bosio; Patrick Girard 001; Arnaud Virazel; Paolo Bernardi; Matteo Sonza Reorda (ISVLSI, 2016)

Improving Functional and Structural Test Solutions for Integrated Circuits. (Amélioration des solutions de test fonctionnel et structurel des circuits intégrés). - Aymen Touati (2016)

Microprocessor Testing: Functional Meets Structural Test. - Aymen Touati; Alberto Bosio; Patrick Girard 001; Arnaud Virazel; Paolo Bernardi; Matteo Sonza Reorda (J. Circuits Syst. Comput., 2017)

Scan-Chain Intra-Cell Aware Testing. - Aymen Touati; Alberto Bosio; Patrick Girard 001; Arnaud Virazel; Paolo Bernardi; Matteo Sonza Reorda; Etienne Auvray (IEEE Trans. Emerg. Top. Comput., 2018)