A probabilistic test instrument using a ΣΔ-encoded amplitude/phase-signal generation technique. - Azhar A. Chowdhury; Gordon W. Roberts (ISCAS, 2012)

A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O. - Yan Li 024; Steven Bielby; Azhar A. Chowdhury; Gordon W. Roberts (J. Electron. Test., 2016)