Generic simulator for faulty IC. - Julie Ferrigno; Aziz Machouat; Philippe Perdu; Dean Lewis; Gérald Haller; Vincent Goubier (Microelectron. Reliab., 2008)

Effect of physical defect on shmoos in CMOS DSM technologies. - Aziz Machouat; Gérald Haller; Vincent Goubier; Dean Lewis; Philippe Perdu; Vincent Pouget; Pascal Fouillat; Fabien Essely (Microelectron. Reliab., 2008)

Net integrity checking by optical localization techniques. - Gérald Haller; Aziz Machouat; Dean Lewis; Vincent Pouget (Microelectron. Reliab., 2009)