External memory BIST for system-in-package. - Kaname Yamasaki; Iwao Suzuki; Azumi Kobayashi; Keiichi Horie; Yasuharu Kobayashi; Hideyuki Aoki; Hideki Hayashi; Kenichi Tada; Koki Tsutsumida; Keiichi Higeta (ITC, 2005)

Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis. - Sanae Seike; Ken Namura; Yukio Ohya; Anis Uzzaman; Shinichi Arima; Dale Meehl; Vivek Chickermane; Azumi Kobayashi; Satoshi Tanaka; Hiroyuki Adachi (ATS, 2006)