Impact of random telegraph noise on ring oscillators evaluated by circuit-level simulations. - Azusa Oshima; Pieter Weckx; Ben Kaczer; Kazutoshi Kobayashi; Takashi Matsumoto (ICICDT, 2015)

Negative bias temperature instability caused by plasma induced damage in 65 nm bulk and Silicon on thin BOX (SOTB) processes. - Ryo Kishida; Azusa Oshima; Kazutoshi Kobayashi (IRPS, 2015)