Non-destructive high temperature characterisation of high-voltage IGBTs. - Giovanni Busatto; B. Cascone; Luigi Fratelli; M. Balsamo; Francesco Iannuzzo; Francesco Velardi (Microelectron. Reliab., 2002)

The robustness of series-connected high power IGBT modules. - Carmine Abbate; Giovanni Busatto; Luigi Fratelli; Francesco Iannuzzo; B. Cascone; Roberta Manzo (Microelectron. Reliab., 2007)