Simulation and experimental comparison of GGNMOS and LVTSCR protection cells under ElectroStatic Discharges. - A. Guilhaume; Philippe Galy; J. P. Chante; B. Foucher; F. Blanc (Microelectron. Reliab., 2001)

A review of reliability prediction methods for electronic devices. - B. Foucher; J. Boullié; B. Meslet; D. Das (Microelectron. Reliab., 2002)

Experimental and 3D simulation correlation of a gg-nMOS transistor under high current pulse. - Philippe Galy; V. Berland; B. Foucher; A. Guilhaume; J. P. Chante; S. Bardy; F. Blanc (Microelectron. Reliab., 2002)

Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics. - E. Scanff; K. L. Feldman; S. Ghelam; Peter Sandborn; M. Glade; B. Foucher (Microelectron. Reliab., 2007)

Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics. - F. Molière; B. Foucher; Philippe Perdu; Alain Bravaix (Microelectron. Reliab., 2009)