Reliability Testing by Precise Electrical Measurement. - A. P. Dorey; B. K. Jones; Andrew Mark David Richardson; P. C. Russell; Y. Z. Xu (ITC, 1988)

The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. - B. K. Jones; C. N. Graham; A. Konczakowska; L. Hasse (Microelectron. Reliab., 2001)

Logarithmic distributions in reliability analysis. - B. K. Jones (Microelectron. Reliab., 2002)