Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. - B. Khong; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Marc Legros; A. Deram; Colette Levade; G. Vanderschaeve; Jean-Marie Dorkel; Jean-Pierre Fradin (Microelectron. Reliab., 2005)

Characterization and modelling of ageing failures on power MOSFET devices. - B. Khong; Marc Legros; Patrick Tounsi; Philippe Dupuy; X. Chauffleur; Colette Levade; G. Vanderschaeve; Emmanuel Scheid (Microelectron. Reliab., 2007)