Simulated verification of NC part programs from 2D images. - S. Srinivasa Rao 003; B. Satyanarayana; M. M. M. Sarcar (Int. J. Comput. Integr. Manuf., 2011)

Effect of electron irradiation on morphological, compositional and electrical properties of nanocluster carbon thin films grown using room temperature based cathodic arc process for large area microelectronics. - Shounak De; B. Satyanarayana; Ganesh Sanjeev; K. Ramakrishna; K. Mohan Rao; Manjunatha Pattabi (Microelectron. Reliab., 2014)