A monolithic off-chip IDDQ monitor. - M. Svajda; B. Straka; Hans A. R. Manhaeve (ED&TC, 1997)

A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. - B. Straka; Hans A. R. Manhaeve; Jozef Vanneuville; M. Svajda (DATE, 1998)

IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. - M. Svajda; B. Straka; Hans A. R. Manhaeve (DATE, 1998)

Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology. - Hans A. R. Manhaeve; Johan Verfaillie; B. Straka; J. P. Cornil (J. Electron. Test., 2000)

Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality. - B. Straka; Hans A. R. Manhaeve; J. Brenkus; Stefaan Kerckenaere (DATE, 2008)