Extraction of 3D parasitic capacitances in 90 nm and 22 nm NAND flash memories. - Jérémy Postel-Pellerin; Frédéric Lalande; Pierre Canet; Rachid Bouchakour; F. Jeuland; B. Bertello; B. Villard (Microelectron. Reliab., 2009)

Analysis and optimization of lateral thin-film Silicon-on-insulator (SOI) MOSFET transistors. - Ignasi Cortés; Gaëtan Toulon; Frederic Morancho; E. Hugonnard-Bruyere; B. Villard; W. J. Toren (Microelectron. Reliab., 2012)