A novel method of reliability-centered process optimization for additive manufacturing. - Zhipeng Ye; Jiawei Zhu; Qian Li; Bing Mo; Baimao Lei; Yaqiu Li; Chunhui Wang; Chuangmian Huang (Microelectron. Reliab., 2018)

A novel operational reliability and state prediction method based on degradation hidden Markov model with random threshold. - Chenyu Jiang 001; Qiang Chen; Baimao Lei (Qual. Reliab. Eng. Int., 2025)