Weak Feature Defect Detection of Insulators Considering Class Boundaries and Interclass Dependencies. - Nan Shao; Guofeng Zou; Liangyu Wei; Bangzheng Han; Xiaofei Zhang; Xinyu Zhao (IEEE Trans. Instrum. Meas., 2024)

Low-Voltage Alternating Current Series Arc Fault Detection Using Periodic Background Subtraction and Linear Dividing Lines. - Xiaofei Zhang; Jinjie Li; Bangzheng Han; Wei Wang 440; Guofeng Zou (IEEE Access, 2025)