An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits. - Baojun Liu 001; Li Cai; Xiaoqiang Liu (J. Electron. Test., 2020)

Effect of temperature and single event transient on crosstalk in coupled single-walled carbon nanotube (SWCNT) bundle interconnects. - Baojun Liu 001; Cheng Li; Chuang Li; Shuang Zhang (Int. J. Circuit Theory Appl., 2021)

Model and analysis of single event transient sensitivity based on uncertainty quantification. - Baojun Liu 001; Li Cai (Microprocess. Microsystems, 2022)

Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET. - Baojun Liu 001; Xiaokuo Yang; Jing Zhu (Microelectron. J., 2024)

An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET. - Baojun Liu 001; Li Cai; Chuang Li (J. Electron. Test., 2024)