Characteristics analysis and optimization design of a new ESD power clamp circuit. - Hongxia Liu; Baojun Tang; Yue Hao (Microelectron. Reliab., 2010)

As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability. - Baojun Tang; Kris Croes; Yohan Barbarin; Yunqi Wang; Robin Degraeve; Yunlong Li; Maria Toledano-Luque; Thomas Kauerauf; Jürgen Bömmels; Zsolt Tökei; Ingrid De Wolf (Microelectron. Reliab., 2014)

Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations. - Baojun Tang; Weidong Zhang 002; Laurent Breuil; Colin Robinson; Yunqi Wang; Maria Toledano-Luque; Geert Van den Bosch; Jianfu Zhang 001; Jan Van Houdt (Microelectron. Reliab., 2014)

Constant voltage electromigration for advanced BEOL copper interconnects. - Baojun Tang; Kris Croes; Nicolas Jourdan 002; Jürgen Bömmels; Zsolt Tökei; Ingrid De Wolf; Eric Wilcox; Timothy McMullen (IRPS, 2015)

Factors of carbon price volatility in a comparative analysis of the EUA and sCER. - Baojun Tang; Pi-qin Gong; Cheng Shen (Ann. Oper. Res., 2017)

Low carbon operation optimisation strategies for heating, ventilation and air conditioning systems in office buildings. - Meng Shen; Baojun Tang; Keai Zhang (Int. J. Prod. Res., 2024)