A Measurement Study on the (In)security of End-of-Life (EoL) Embedded Devices. - Dingding Wang 003; Muhui Jiang; Rui Chang; Yajin Zhou; Baolei Hou; Xiapu Luo; Lei Wu 012; Kui Ren 001 (CoRR, 2021)

An Empirical Study on the Insecurity of End-of-Life (EoL) IoT Devices. - Dingding Wang 003; Muhui Jiang; Rui Chang; Yajin Zhou; Hexiang Wang; Baolei Hou; Lei Wu 012; Xiapu Luo (IEEE Trans. Dependable Secur. Comput., 2024)