A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride-oxide dielectrics. - Fen Chen; Rolf-Peter Vollertsen; Baozhen Li; Dave Harmon; Wing L. Lai (Microelectron. Reliab., 2002)

Transformation & Countermeasures on Business Operation Models in Uncertain Environment. - Baozhen Li; Nana Li; Xianfeng Liu (ICEB, 2004)

Reliability challenges for copper interconnects. - Baozhen Li; Timothy D. Sullivan; Tom C. Lee; Dinesh Badami (Microelectron. Reliab., 2004)

Application of three-parameter lognormal distribution in EM data analysis. - Baozhen Li; Emmanuel Yashchin; Cathryn Christiansen; Jason Gill; Ronald Filippi; Timothy D. Sullivan (Microelectron. Reliab., 2006)

Neural Network Approach Based on Agent to Predict Stock Performance. - Shengnan Xu; Baozhen Li; Yanhua Shao (CSSE (1), 2008)

Electromigration challenges for advanced on-chip Cu interconnects. - Baozhen Li; Cathryn Christiansen; Dinesh Badami; Chih-Chao Yang (Microelectron. Reliab., 2014)

A case study of electromigration reliability: From design point to system operations. - Baozhen Li; K. Paul Muller; James D. Warnock; Leon J. Sigal; Dinesh Badami (IRPS, 2015)

A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL). - Ernest Y. Wu; James H. Stathis; Baozhen Li; Barry P. Linder; Kai Zhao; Griselda Bonilla (IRPS, 2015)

Transient self-heating modeling and simulations of back-end-of-line interconnects. - Andrew Kim; Baozhen Li; Barry P. Linder (IRPS, 2018)

Electromigration characteristics of power grid like structures. - Baozhen Li; Andrew Kim; Paul McLaughlin; Barry P. Linder; Cathryn Christiansen (IRPS, 2018)

Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications. - Ernest Y. Wu; Andrew Kim; Baozhen Li; James H. Stathis (IRPS, 2018)

Transformation of Ramped Current Stress VBDto Constant Voltage Stress TDDB TBD. - Andrew Kim; Ernest Y. Wu; Baozhen Li; Barry P. Linder (IRPS, 2019)

Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL/FEOL Applications. - Ernest Y. Wu; Baozhen Li; James H. Stathis; Andrew Kim (IRPS, 2019)

A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation. - Ernest Y. Wu; Ron Bolam; Baozhen Li; Tian Shen; Barry P. Linder; Griselda Bonilla; Miaomiao Wang 006; Dechao Guo (IRPS, 2022)

Quantum Mechanical Connection of Schottky Emission Process and Its implications on Breakdown Methodology and Conduction Modeling for BEOL Low-k Dielectrics. - Ernest Y. Wu; Baozhen Li (IRPS, 2022)

Tomato leaf disease identification based on attention and inception mechanism. - Guangyuan Zhao; Baozhen Li; Xu Huang (AIPR, 2023)

A Systematic Study of Temperature, Polarity, Thickness, and Ramp Rate Dependencies of Ramp-Voltage Stress for SiO2 and its Comparison with 2D Gate Dielectrics. - Ernest Y. Wu; Richard G. Southwick; Baozhen Li (IRPS, 2025)