Robust segmentation and accurate target definition for positron emission tomography images using Affinity Propagation. - Brent Foster; Ulas Bagci; Brian Luna; Bappaditya Dey; William Bishai; Sanjay Jain 002; Ziyue Xu 001; Daniel J. Mollura (ISBI, 2013)

Segmentation of PET Images for Computer-Aided Functional Quantification of Tuberculosis in Small Animal Models. - Brent Foster; Ulas Bagci; Ziyue Xu 001; Bappaditya Dey; Brian Luna; William Bishai; Sanjay Jain 002; Daniel J. Mollura (IEEE Trans. Biomed. Eng., 2014)

Repair techniques for aged TSVs in 3D integrated circuits. - Siroos Madani; Kasem Khalil; Bappaditya Dey; Devante Bonton; Magdy A. Bayoumi (HLDVT, 2017)

Fast deep pyramid DPM object detection with region proposal networks. - Alaa Ali; Oladiran G. Olaleye; Bappaditya Dey; Magdy A. Bayoumi (ISSPIT, 2017)

A Low Power Hardware Implementation of Multi-Object DPM Detector for Autonomous Driving. - Alaa Ali; Oladiran G. Olaleye; Bappaditya Dey; Kasem Khalil; Magdy A. Bayoumi (ICASSP, 2018)

Spectrum-Awareness-Based Performance and Scalability of Cognitive Radio Networks. - Oladiran G. Olaleye; Alaa Ali; Kasem Khalil; Bappaditya Dey; Dmitri D. Perkins; Magdy A. Bayoumi (ICC Workshops, 2018)

Neuro-NoC: Energy Optimization in Heterogeneous Many-Core NoC using Neural Networks in Dark Silicon Era. - Md Farhadur Reza; Tung Thanh Le; Bappaditya Dey; Magdy A. Bayoumi; Dan Zhao 001 (ISCAS, 2018)

A Novel Design Gate based Low-Cost Configurable RO PUF using Reversible Logic. - Bappaditya Dey; Kasem Khalil; Ashok Kumar 001; Magdy A. Bayoumi (MWSCAS, 2019)

A Novel Reconfigurable Hardware Architecture of Neural Network. - Kasem Khalil; Omar Eldash; Bappaditya Dey; Ashok Kumar 001; Magdy A. Bayoumi (MWSCAS, 2019)

A Novel Design Reversible Logic Based Configurable Fault-Tolerant Embryonic Hardware. - Kasem Khalil; Bappaditya Dey; Yasser Sherazi; Ashok Kumar 001; Magdy A. Bayoumi (ISCAS, 2020)

A Reversible-Logic based Architecture for Artificial Neural Network. - Bappaditya Dey; Kasem Khalil; Ashok Kumar 001; Magdy A. Bayoumi (MWSCAS, 2020)

Architecture of A Novel Low-Cost Hardware Neural Network. - Kasem Khalil; Omar Eldash; Bappaditya Dey; Ashok Kumar 001; Magdy A. Bayoumi (MWSCAS, 2020)

A Reversible-Logic based Architecture for VGGNet. - Bappaditya Dey; Kasem Khalil; Ashok Kumar 001; Magdy A. Bayoumi (ICECS, 2021)

An Efficient Reconfigurable Neural Network on Chip. - Kasem Khalil; Bappaditya Dey; Mostafa Abdelrehim; Ashok Kumar 001; Magdy A. Bayoumi (ICECS, 2021)

A Reversible-Logic Based Architecture for Long Short-Term Memory (LSTM) Network. - Kasem Khalil; Bappaditya Dey; Ashok Kumar 001; Magdy A. Bayoumi (ISCAS, 2021)

A Reversible-Logic based Architecture for Convolutional Neural Network (CNN). - Kasem Khalil; Bappaditya Dey; Ashok Kumar 001; Magdy A. Bayoumi (MWSCAS, 2021)

An Efficient Embryonic Hardware Architecture based on Network-on-Chip. - Kasem Khalil; Omar Eldash; Bappaditya Dey; Ashok Kumar 001; Magdy A. Bayoumi (MWSCAS, 2021)

A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder (ICECS 2022, 2022)

Adaptive Hardware Architecture for Neural-Network-on-Chip. - Kasem Khalil; Bappaditya Dey; Ashok Kumar 001; Magdy A. Bayoumi (MWSCAS, 2022)

Code Generation Using Machine Learning: A Systematic Review. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder; Stefan De Gendt; Wannes Meert (IEEE Access, 2022)

Deep Learning-Based Defect Classification and Detection in SEM Images. - Bappaditya Dey; Dipam Goswami; Sandip Halder; Kasem Khalil; Philippe Leray 002; Magdy A. Bayoumi (CoRR, 2022)

Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach. - Bappaditya Dey; Enrique Dehaerne; Kasem Khalil; Sandip Halder; Philippe Leray 002; Magdy A. Bayoumi (CoRR, 2022)

Applying Machine Learning Models on Metrology Data for Predicting Device Electrical Performance. - Bappaditya Dey; Anh Tuan Ngo; Sara Sacchi; Víctor Blanco; Philippe Leray 002; Sandip Halder (PKDD/ECML Workshops (4), 2023)

Optimizing YOLOv7 for Semiconductor Defect Detection. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder; Stefan De Gendt (CoRR, 2023)

SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. - MinJin Hwang; Bappaditya Dey; Enrique Dehaerne; Sandip Halder; Young-han Shin (CoRR, 2023)

A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder; Stefan De Gendt (CoRR, 2023)

SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation. - Vic De Ridder; Bappaditya Dey; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2023)

YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. - Enrique Dehaerne; Bappaditya Dey; Hossein Esfandiar; Lander Verstraete; Hyo Seon Suh; Sandip Halder; Stefan De Gendt (CoRR, 2023)

SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. - Vic De Ridder; Bappaditya Dey; Enrique Dehaerne; Sandip Halder; Stefan De Gendt; Bartel Van Waeyenberge (CoRR, 2023)

Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. - Thibault Lechien; Enrique Dehaerne; Bappaditya Dey; Víctor Blanco; Sandip Halder; Stefan De Gendt (CoRR, 2023)

Deep learning denoiser assisted roughness measurements extraction from thin resists with low Signal-to-Noise Ratio(SNR) SEM images: analysis with SMILE. - Sara Sacchi; Bappaditya Dey; Iacopo Mochi; Sandip Halder; Philippe Leray 002 (CoRR, 2023)

Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. - Enrique Dehaerne; Bappaditya Dey; Sandip Halder; Stefan De Gendt (CoRR, 2023)

Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy. - Vic De Ridder; Bappaditya Dey; Víctor Blanco; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2023)

A Machine Learning Approach Towards SKILL Code Autocompletion. - Enrique Dehaerne; Bappaditya Dey; Wannes Meert (CoRR, 2023)

Advancing SEM Based Nano-scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes. - Bappaditya Dey; Matthias Monden; Víctor Blanco; Sandip Halder; Stefan De Gendt (ECCV Workshops (4), 2024)

Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS. - Ying-Lin Chen; Jacob Deforce; Vic De Ridder; Bappaditya Dey; Víctor Blanco; Sandip Halder; Philippe Leray 002 (CoRR, 2024)

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images. - Bappaditya Dey; Vic De Ridder; Víctor Blanco; Sandip Halder; Bartel Van Waeyenberge (CoRR, 2024)

An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection. - Amit Prasad; Bappaditya Dey; Victor Blanco; Sandip Halder (CoRR, 2024)

Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review. - Ying-Lin Chen; Sara Sacchi; Bappaditya Dey; Víctor Blanco; Sandip Halder; Philippe Leray 002; Stefan De Gendt (IEEE Trans. Artif. Intell., 2024)

S²RNN: Self-Supervised Reconfigurable Neural Network Hardware Accelerator for Machine Learning Applications. - Kasem Khalil; Bappaditya Dey; Magdy A. Bayoumi (IEEE Internet Things J., 2025)

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series. - Bappaditya Dey; Daniel Sorensen; MinJin Hwang; Sandip Halder (CoRR, 2025)