Failure analysis of GaAs microwave devices with plastic encapsulation by electro-optical techniques. - W. Ben Naceur; Nathalie Malbert; Nathalie Labat; Hélène Frémont; D. Carisetti; J. C. Clement; J. L. Muraro; Barbara Bonnet (Microelectron. Reliab., 2013)

Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices. - K. Adokanou; Karim Inal; Pierre Montmitonnet; F. Pressecq; Barbara Bonnet; J. L. Muraro (Microelectron. Reliab., 2015)