VLSI Design and Test Sequence in an Academic Environment: A Case Study. - Pawel Nowakowski; Barbara Dziurla-Rucinska; Andrzej Rucinski 002 (MSE, 1999)

Boundary Scan as a Test Solution in Microelectronics Curricula. - Andrzej Rucinski 002; Barbara Dziurla-Rucinska (DELTA, 2002)