Fault Dictionary Size Reduction through Test Response Superposition. - Baris Arslan; Alex Orailoglu (ICCD, 2002)

Extracting Precise Diagnosis of Bridging Faults from Stuck-at Fault Information. - Baris Arslan; Alex Orailoglu (Asian Test Symposium, 2003)

CircularScan: A Scan Architecture for Test Cost Reduction. - Baris Arslan; Alex Orailoglu (DATE, 2004)

Design space exploration for aggressive test cost reduction in CircularScan architectures. - Baris Arslan; Alex Orailoglu (ICCAD, 2004)

Extending the Applicability of Parallel-Serial Scan Designs. - Baris Arslan; Ozgur Sinanoglu; Alex Orailoglu (ICCD, 2004)

Test Cost Reduction Through A Reconfigurable Scan Architecture. - Baris Arslan; Alex Orailoglu (ITC, 2004)

Delay test quality maximization through process-aware selection of test set size. - Baris Arslan; Alex Orailoglu (ICCD, 2010)

Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost. - Baris Arslan; Alex Orailoglu (Asian Test Symposium, 2011)

Adaptive test optimization through real time learning of test effectiveness. - Baris Arslan; Alex Orailoglu (DATE, 2011)

Delay test resource allocation and scheduling for multiple frequency domains. - Baris Arslan; Alex Orailoglu (VTS, 2012)

Full exploitation of process variation space for continuous delivery of optimal delay test quality. - Baris Arslan; Alex Orailoglu (ASP-DAC, 2013)

Tracing the best test mix through multi-variate quality tracking. - Baris Arslan; Alex Orailoglu (VTS, 2013)

Adaptive Test Cost and Quality Optimization Through An Effective Yet Efficient Delivery of Chip Specific Tests. - Baris Arslan (2013)

Small delay defect diagnosis through failure observation ordering. - Baris Arslan (AQTR, 2016)

Power-Aware Delay Test Quality Optimization for Multiple Frequency Domains. - Baris Arslan; Alex Orailoglu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment. - Baris Arslan; Alex Orailoglu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Test Cost-Test Quality Modeling For Adaptive Test. - Bekir Zahit Demiray; Baris Arslan (AQTR, 2022)