Design and test of analog circuits towards sub-ppm level. - Georges G. E. Gielen; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Baris Esen (ITC, 2014)

Automatic generation of autonomous built-in observability structures for analog circuits. - Anthony Coyette; Baris Esen; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (ETS, 2015)

Automated testing of mixed-signal integrated circuits by topology modification. - Anthony Coyette; Baris Esen; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (VTS, 2015)

Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. - Anthony Coyette; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (ITC, 2016)

Analog fault coverage improvement using final-test dynamic part average testing. - Wim Dobbelaere; Ronny Vanhooren; Willy De Man; Koen Matthijs; Anthony Coyette; Baris Esen; Georges G. E. Gielen (ITC, 2016)

Effective DC fault models and testing approach for open defects in analog circuits. - Baris Esen; Anthony Coyette; Georges G. E. Gielen; Wim Dobbelaere; Ronny Vanhooren (ITC, 2016)

Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization. - Anthony Coyette; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (Integr., 2016)

A very low cost and highly parallel DfT method for analog and mixed-signal circuits. - Baris Esen; Anthony Coyette; Nektar Xama; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (ETS, 2017)

Automatic testing of analog ICs for latent defects using topology modification. - Nektar Xama; Anthony Coyette; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (ETS, 2017)

Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. - Baris Esen; Anthony Coyette; Nektar Xama; Wim Dobbelaere; Ronny Vanhooren; Georges G. E. Gielen (ITC, 2017)

Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. - Georges G. E. Gielen; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Nektar Xama (ISCAS, 2018)

ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. - Anthony Coyette; Baris Esen; Nektar Xama; Georges G. E. Gielen; Wim Dobbelaere; Ronny Vanhooren (IEEE Des. Test, 2018)

An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes. - Baris Esen; Anthony Coyette; Nektar Xama; Georges G. E. Gielen; Wim Dobbelaere; Ronny Vanhooren (IEEE Des. Test, 2018)

Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. - Nektar Xama; Martin Andraud; Jhon Gomez; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Georges G. E. Gielen (ACM Trans. Design Autom. Electr. Syst., 2020)