Dependence of Post-Breakdown Conduction on Gate Oxide Thickness. - Salvatore Lombardo; James H. Stathis; Barry P. Linder (Microelectron. Reliab., 2002)

Analysis of the effect of the gate oxide breakdown on SRAM stability. - Rosana Rodríguez; James H. Stathis; Barry P. Linder; Steven P. Kowalczyk; Ching-Te Chuang; Rajiv V. Joshi; Gregory A. Northrop; Kerry Bernstein; Azeez J. Bhavnagarwala; Salvatore Lombardo (Microelectron. Reliab., 2002)

Influence and model of gate oxide breakdown on CMOS inverters. - Rosana Rodríguez; James H. Stathis; Barry P. Linder; Rajiv V. Joshi; Ching-Te Chuang (Microelectron. Reliab., 2003)

Reliability of ultra-thin oxides in CMOS circuits. - James H. Stathis; Barry P. Linder; Rosana Rodríguez; Salvatore Lombardo (Microelectron. Reliab., 2003)

Circuit implications of gate oxide breakdown. - James H. Stathis; Rosana Rodríguez; Barry P. Linder (Microelectron. Reliab., 2003)

Improving and optimizing reliability in future technologies with high-κ dielectrics. - Barry P. Linder; Eduard Cartier; S. Krishnan; Ernest Y. Wu (VLSI-DAT, 2013)

Analyzing path delays for accelerated testing of logic chips. - Emily Ray; Barry P. Linder; Raphael Robertazzi; Kevin Stawiasz; Alan J. Weger; Emmanuel Yashchin; James H. Stathis; Peilin Song (IRPS, 2015)

Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements. - Franco Stellari; Keith A. Jenkins; Alan J. Weger; Barry P. Linder; Peilin Song (IRPS, 2015)

A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL). - Ernest Y. Wu; James H. Stathis; Baozhen Li; Barry P. Linder; Kai Zhao; Griselda Bonilla (IRPS, 2015)

Transient self-heating modeling and simulations of back-end-of-line interconnects. - Andrew Kim; Baozhen Li; Barry P. Linder (IRPS, 2018)

Electromigration characteristics of power grid like structures. - Baozhen Li; Andrew Kim; Paul McLaughlin; Barry P. Linder; Cathryn Christiansen (IRPS, 2018)

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. - Franco Stellari; Alan J. Weger; Keith A. Jenkins; Giuseppe La Rosa; Barry P. Linder; Peilin Song (IRPS, 2018)

Transformation of Ramped Current Stress VBDto Constant Voltage Stress TDDB TBD. - Andrew Kim; Ernest Y. Wu; Baozhen Li; Barry P. Linder (IRPS, 2019)

Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery. - Elnatan Mataev; James H. Stathis; Giuseppe La Rosa; Barry P. Linder (IRPS, 2019)

A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation. - Ernest Y. Wu; Ron Bolam; Baozhen Li; Tian Shen; Barry P. Linder; Griselda Bonilla; Miaomiao Wang 006; Dechao Guo (IRPS, 2022)