Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components. - Bart Vandevelde; Filip Vanhee; Davy Pissoort; Lieven Degrendele; Johan de Baets; Bart Allaert; Ralph Lauwaert; Franco Zanon; Riet Labie; Geert Willems (Microelectron. Reliab., 2017)

Study of a Narrow Fabric-Based E-Textile System - From Research to Field Tests. - Paula Veske-Lepp; Bjorn Vandecasteele; Filip Thielemans; Vera De Glas; Severine Delaplace; Bart Allaert; Kurt Dewulf; Annick Depré; Frederick Bossuyt (Sensors, 2024)