Reliability assessment on new reprogrammable non-volatile memory devices based on SiCr-O. - Yuan Li; Romain Delangle; Xiao-mei Zhang; Bart Hovens (Microelectron. Reliab., 2011)

Characterization and modeling of depletion-type nMOS transistors for RF switches with zero power consumption in ON-state. - Cristian Andrei; Denis Raoulx; Guy Imbert; Bart Hovens; Andrea Scarpa (ICICDT, 2013)