Reliability of power transistors against application driven temperature swings. - Sudha Gopalan; Benno H. Krabbenborg; Jan-Hein Egbers; Bart van Velzen; Rene Zingg (Microelectron. Reliab., 2002)

5.8 A 20W CMOS/LDMOS All-Digital Transmitter with Dynamic Retiming and Glitch-Free Phase Mapper, Achieving 68%/62% Peak Drain/System Efficiency. - Dieuwert Peter Nicolaas Mul; Rob Bootsman; Mohammadreza Beikmirza; Ossama El Boustani; Yiyu Shen; Daniel Maassen; Bart van Velzen; Mohadig Rousstia; Ronald Koster; John R. Gajadharsing; Thomas Fritzsch; Morteza S. Alavi; et al. (ISSCC, 2025)