Test Sequence-Optimized BIST for Automotive Applications. - Bartosz Kaczmarek; Grzegorz Mrugalski; Nilanjan Mukherjee 001; Janusz Rajski; Lukasz Rybak 001; Jerzy Tyszer (ETS, 2020)

Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs. - Jean-François Côté; Mark Kassab; Wojciech Janiszewski; Ricardo Rodrigues 008; Reinhard Meier; Bartosz Kaczmarek; Peter Orlando; Geir Eide; Janusz Rajski; Glenn Colón-Bonet; Naveen Mysore; Ya Yin; et al. (ITC, 2020)

LBIST for Automotive ICs With Enhanced Test Generation. - Bartosz Kaczmarek; Grzegorz Mrugalski; Nilanjan Mukherjee 001; Artur Pogiel; Janusz Rajski; Lukasz Rybak 001; Jerzy Tyszer (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)