IDDQ testing because 'zero defects isn't enough': a Philips perspective. - Keith Baker; Bas Verhelst (ITC, 1990)

Functional and IDDQ testing on a static RAM. - R. Meershoek; Bas Verhelst; Rory McInerney; Loek Thijssen (ITC, 1990)

Development of a new standard for test. - William W. Sebesta; Bas Verhelst; Michael G. Wahl (ITC, 1990)

Using a Test-Specification Format in Automatic Test-Program Generation. - Bas Verhelst (IEEE Des. Test Comput., 1990)

Using EDIF for Transfer of Test Data: Practical Experience. - Bas Verhelst; Richard Morren; Keith Baker (ITC, 1992)