Multi-feature sparse-based defect detection and classification in semiconductor units. - Bashar Haddad 001; Lina J. Karam; Jieping Ye; Nital Patel; Martin W. Braun (ICIP, 2016)

Multifeature, Sparse-Based Approach for Defects Detection and Classification in Semiconductor Units. - Bashar Haddad 001; Sen Yang; Lina J. Karam; Jieping Ye; Nital S. Patel; Martin W. Braun (IEEE Trans Autom. Sci. Eng., 2018)

BagStack Classification for Data Imbalance Problems with Application to Defect Detection and Labeling in Semiconductor Units. - Bashar Muneer Haddad (2019)