Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT. - Cezary Sydlo; Bastian Mottet; Husin Ganis; Hans L. Hartnagel; Viktor Krozer; Sylvain L. Delage; Simone Cassette; Eric Chartier; D. Floriot; Steven Bland (Microelectron. Reliab., 2001)

Process Control and Failure Analysis Implementation for THz Schottky-based components. - V. Ichizli; Manuel Rodríguez-Gironés; L. Marchand; C. Garden; Oleg Cojocari; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2002)

Reliability investigations on HBV using pulsed electrical stress. - Cezary Sydlo; M. Saglam; Bastian Mottet; Manuel Rodríguez-Gironés; Hans L. Hartnagel (Microelectron. Reliab., 2002)

Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress. - Cezary Sydlo; Kabula Mutamba; L. Divac Krnic; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2003)

A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes. - Stephan Biber; Oleg Cojocari; Günther Rehm; Bastian Mottet; Manuel Rodríguez-Gironés; Lorenz-Peter Schmidt; Hans L. Hartnagel (IEEE Trans. Instrum. Meas., 2004)

Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning. - Cezary Sydlo; Jochen Sigmund; Bastian Mottet; Hans L. Hartnagel (Microelectron. Reliab., 2005)