Side-Channel Attacks on the Yubikey 2 One-Time Password Generator. - David F. Oswald; Bastian Richter 001; Christof Paar (RAID, 2013)

Microcontrollers as (In)Security Devices for Pervasive Computing Applications. - Daehyun Strobel; David F. Oswald; Bastian Richter 001; Falk Schellenberg; Christof Paar (Proc. IEEE, 2014)

On the Complexity Reduction of Laser Fault Injection Campaigns Using OBIC Measurements. - Falk Schellenberg; Markus Finkeldey; Bastian Richter 001; Maximilian Schapers; Nils Gerhardt; Martin Hofmann 017; Christof Paar (FDTC, 2015)

Static Power Side-Channel Analysis of a Threshold Implementation Prototype Chip. - Thorben Moos; Amir Moradi 001; Bastian Richter 001 (IACR Cryptol. ePrint Arch., 2016)

SAT-based reverse engineering of gate-level schematics using fault injection and probing. - Shahrzad Keshavarz; Falk Schellenberg; Bastian Richter 001; Christof Paar; Daniel E. Holcomb (HOST, 2018)

Static Power Side-Channel Analysis - A Survey on Measurement Factors. - Thorben Moos; Amir Moradi 001; Bastian Richter 001 (IACR Cryptol. ePrint Arch., 2018)

Leakage Detection with the x2-Test. - Amir Moradi 001; Bastian Richter 001; Tobias Schneider 002; François-Xavier Standaert (IACR Trans. Cryptogr. Hardw. Embed. Syst., 2018)

A Comparison of χ 2-Test and Mutual Information as Distinguisher for Side-Channel Analysis. - Bastian Richter 001; David Knichel; Amir Moradi 001 (CARDIS, 2019)

A Comparison of Chi^2-Test and Mutual Information as Distinguisher for Side-Channel Analysis. - Bastian Richter 001; David Knichel; Amir Moradi 001 (IACR Cryptol. ePrint Arch., 2019)

Automated Probe Repositioning for On-Die EM Measurements. - Bastian Richter 001; Alexander Wild; Amir Moradi 001 (IACR Cryptol. ePrint Arch., 2019)

Lightweight Ciphers on a 65 nm ASIC - A Comparative Study on Energy Consumption. - Bastian Richter 001; Amir Moradi 001 (IACR Cryptol. ePrint Arch., 2020)

Template attacks on nano-scale CMOS devices. - Bastian Richter 001; Amir Moradi 001 (J. Cryptogr. Eng., 2020)

Static Power Side-Channel Analysis - An Investigation of Measurement Factors. - Thorben Moos; Amir Moradi 001; Bastian Richter 001 (IEEE Trans. Very Large Scale Integr. Syst., 2020)

Advanced side-channel measurement and testing. - Bastian Richter 001 (2021)