Variability sources and reliability of 3D - FeFETs. - Milan Pesic; Bastien Beltrando; Andrea Padovani; Shruba Gangopadhyay; Muthukumar Kaliappan; Michael Haverty; Marco A. Villena; Enrico Piccinini; Matteo Bertocchi; Tony Chiang; Luca Larcher; Jack Strand; et al. (IRPS, 2021)

Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents. - Milan Pesic; Andrea Padovani; Tommaso Rollo; Bastien Beltrando; Jack Strand; Parnika Agrawal; Alexander L. Shluger; Luca Larcher (IMW, 2022)

Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation. - Milan Pesic; Bastien Beltrando; Andrea Padovani; Toshihiko Miyashita; Nam-Sung Kim; Luca Larcher (IRPS, 2022)

Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND. - Milan Pesic; Bastien Beltrando; Tommaso Rollo; Cristian Zambelli; Andrea Padovani; Rino Micheloni; Rita Maji; Lisa Enman; Mark Saly; Yang Ho Bae; Jung-Bae Kim; Dong Kil Yim; et al. (IRPS, 2023)

Self-rectifying non-volatile tunneling synapse: multiscale modeling augmented development. - Bastien Beltrando; Marco A. Villena; Mondol Anik Kumar; Shruba Gangopadhyay; Deepak Kamalanathan; E. Smith; Nasrin Kazem; Ghazal Saheli; Stephen Weeks; Michael Haverty; Muthukumar Kaliappan; Andrea Padovani; et al. (IMW, 2024)

Low-PBTS defect-engineered high-mobility metal-oxide BEOL transistors. - Bastien Beltrando; Bruno Coppolelli; Jung-Bae Kim; Yang Ho Bae; Stephen Weeks; Lisa Enman; Ghazal Saheli; Davide Cornigli; Stuart Brinkley; Mark Saly; Luca Larcher; Dong Kil Yim; et al. (IRPS, 2024)