Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect. - Yann Weber; Linda Buffo; Béatrice Vanhuffel; Nicholas Lee; Neal Stirlen; Jeff Chen; Xiang-Dong Wang (Microelectron. Reliab., 2014)

Latent gate oxide defects case studies. - Julien Goxe; C. Abouda; Béatrice Vanhuffel (Microelectron. Reliab., 2015)