A deterministic dynamic element matching approach to ADC testing. - Beatriz Olleta; Lance Juffer; Degang Chen 001; Randall L. Geiger (ISCAS (5), 2003)

Testing high resolution ADCs using deterministic dynamic element matching. - Beatriz Olleta; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing. - Beatriz Olleta; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2004)

A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. - Beatriz Olleta; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (ISCAS (1), 2005)

A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. - Beatriz Olleta; Hanjun Jiang; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2006)

Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. - Hanjun Jiang; Beatriz Olleta; Degang Chen 001; Randall L. Geiger (IEEE Trans. Instrum. Meas., 2007)