A Method for Testing Subnanosecond ECL. - Beau R. Wilson Jr. (ITC, 1981)

An Evaluation of the 2816 EEPROM. - Eugene R. Hnatek; Beau R. Wilson Jr. (ITC, 1982)

Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). - Beau R. Wilson Jr.; Eugene R. Hnatek (ITC, 1984)