Amdahl Corporation Board Delay Test System. - Bejoy G. Oomman; Prasad Kongara; Chittaranjan Mallipeddi (ITC, 1992)

A Universal Technique for Accelerating Simulation of Scan Test Patterns. - Bejoy G. Oomman; Wu-Tung Cheng; John A. Waicukauski (ITC, 1996)

Redundancy Requirements for Embedded Memories. - Mo Tamjidi; Bejoy G. Oomman (ISQED, 2001)

Saturating Counters: Application and Design Alternatives. - Israel Koren; Yaron Koren; Bejoy G. Oomman (IEEE Symposium on Computer Arithmetic, 2003)