Power pin testing: making the test coverage complete. - Frans G. M. de Jong; Ben Kup; Rodger Schuttert (ITC, 2000)

Improved Test Monitor Circuit in Power Pin DfT. - Rodger Schuttert; Frans G. M. de Jong; Ben Kup (VTS, 2002)

A forward body bias generator for digital CMOS circuits with supply voltage scaling. - Maurice Meijer; José Pineda de Gyvez; Ben Kup; Bert van Uden; Peter Bastiaansen; Marco Lammers; Maarten Vertregt (ISCAS, 2010)