SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states. - Ben Niewenhuis; Ronald D. Blanton; Mudit Bhargava; Ken Mai (ITC, 2013)

Logic characterization vehicle design for maximal information extraction for yield learning. - Ronald D. Blanton; Ben Niewenhuis; Carl Taylor (ITC, 2014)

Design reflection for optimal test-chip implementation. - R. D. (Shawn) Blanton; Benjamin Niewenhuis; Zeye (Dexter) Liu (ITC, 2015)

Efficient built-in self test of regular logic characterization vehicles. - Ben Niewenhuis; Ronald D. Blanton (VTS, 2015)

Achieving 100% cell-aware coverage by design. - Zeye Liu 001; Ben Niewenhuis; Soumya Mittal; R. D. (Shawn) Blanton (DATE, 2016)

Logic characterization vehicle design reflection via layout rewiring. - Phillip Fynan; Zeye Liu 001; Benjamin Niewenhuis; Soumya Mittal; Marcin Strajwas; R. D. (Shawn) Blanton (ITC, 2016)

Test chip design for optimal cell-aware diagnosability. - Soumya Mittal; Zeye Liu 001; Ben Niewenhuis; R. D. (Shawn) Blanton (ITC, 2016)

Multiple-defect diagnosis for Logic Characterization Vehicles. - Ben Niewenhuis; Soumya Mittal; R. D. (Shawn) Blanton (ETS, 2017)

A Logic Test Chip for Optimal Test and Diagnosis. - Ben Niewenhuis (2018)

Characterization of Locked Combinational Circuits via ATPG. - Danielle Duvalsaint; Xiaoxiao Jin; Benjamin Niewenhuis; R. D. (Shawn) Blanton (ITC, 2019)

Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle. - Ben Niewenhuis; Balaji Ravikumar; Zeye Liu 001; R. D. Shawn Blanton (VTS, 2019)

Improving structural coverage of functional tests with checkpoint signature computation. - Benjamin Niewenhuis; Devanathan Varadarajan (ITC, 2022)