Effect of ions presence in the SiOCH inter metal dielectric structure. - Benjamin Rebuffat; Vincenzo Della Marca; Pascal Masson; Jean-Luc Ogier; Marc Mantelli; Olivier Paulet; Laurent Lopez; Romain Laffont (ESSDERC, 2013)

Effect of AC stress on oxide TDDB and trapped charge in interface states. - Benjamin Rebuffat; Pascal Masson; Jean-Luc Ogier; Marc Mantelli; Romain Laffont (ISIC, 2014)