Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. - Benoit Dubois; Jean-Baptiste Kammerer; Luc Hébrard; Francis Braun (ISQED, 2007)

Modelling of hot-carrier degradation and its application for analog design for reliability. - Benoit Dubois; Jean-Baptiste Kammerer; Luc Hébrard; Francis Braun (Microelectron. J., 2009)

Reliability and Reproducibility of the Cryogenic Sapphire Oscillator Technology. - Christophe Fluhr; Benoit Dubois; Guillaume Le Tetu; Valérie Soumann; Julien Paris; Enrico Rubiola; Vincent Giordano (IEEE Trans. Instrum. Meas., 2023)