A Unified Approach for a Time-Domain Built-In Self-Test Technique and Fault Detection. - Benoit Provost; Edgar Sánchez-Sinencio; Anna Maria Brosa (Great Lakes Symposium on VLSI, 1998)

Auto-calibrating analog timer for on-chip testing. - Benoit Provost; Edgar Sánchez-Sinencio (ITC, 1999)

On-chip ramp generators for mixed-signal BIST and ADC self-test. - Benoit Provost; Edgar Sánchez-Sinencio (IEEE J. Solid State Circuits, 2003)

I/O Self-Leakage Test. - Ali Muhtaroglu; Benoit Provost; Tawfik Rahal-Arabi; Greg Taylor (ITC, 2004)

AC IO Loopback Design for High Speed µProcessor IO Test. - Benoit Provost; Chee How Lim; Mo Bashir; Ali Muhtaroglu; Tiffany Huang; Kathy Tian; Mubeen Atha; Cangsang Zhao; Harry Muljono (ITC, 2004)

A practical self-calibration scheme implementation for pipeline ADC. - Benoit Provost; Edgar Sánchez-Sinencio (IEEE Trans. Instrum. Meas., 2004)

External Loopback Testing Experiences with High Speed Serial Interfaces. - Anne Meixner; Akira Kakizawa; Benoit Provost; Serge Bedwani (ITC, 2008)

Augmenting ESD and EOS physical analysis with per pin ESD and leakage DFT. - Horaira Abu; Salem Abdennadher; Benoit Provost; Harry Muljono (ISQED, 2018)