Magnetic field measurements for Non Destructive Failure Analysis. - Olivier Crépel; C. Goupil; Bernadette Domengès; Philippe Descamps; Philippe Perdu; A. Doukkali (Microelectron. Reliab., 2002)

Comprehensive failure analysis of leakage faults in bipolar transistors. - Bernadette Domengès; P. Schwindenhammer; Patrick Poirier; Felix Beaudoin; Philippe Descamps (Microelectron. Reliab., 2002)

VCO phase noise improvement through direct passive component modification in the FIB. - Bernadette Domengès; B. Tiphaigne (Microelectron. Reliab., 2004)

Isolating failing sites in IC packages using time domain reflectometry: Case studies. - Dolphin Abessolo-Bidzo; Patrick Poirier; Philippe Descamps; Bernadette Domengès (Microelectron. Reliab., 2005)

Comprehensive nanostructural study of SSRM nanocontact on silicon. - T. Delaroque; Bernadette Domengès; A. Colder; K. Danilo (Microelectron. Reliab., 2011)