Leakage paths identification in NVM using biased data retention. - Jérémy Postel-Pellerin; Romain Laffont; Gilles Micolau; Frédéric Lalande; Arnaud Régnier; Bernard Bouteille (Microelectron. Reliab., 2010)

Investigation of the effects of constant voltage stress on thin SiO2 layers using dynamic measurement protocols. - Philippe Chiquet; Pascal Masson; Romain Laffont; Gilles Micolau; Jérémy Postel-Pellerin; Frédéric Lalande; Bernard Bouteille; Jean-Luc Ogier (Microelectron. Reliab., 2012)