On balancing hardware-firmware for designing a fault-tolerant computers' series. - Bernard Courtois; Gabriele Saucier (MICRO (2), 1975)

Etude d'un calculateur tolérant des pannes, ses fiabilité, sécurité, performance et coût. - Bernard Courtois (1976)

Analytical Testing of Data Processing Sections of Integrated CPUs. - Bernard Courtois (ITC, 1981)

A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing. - Claire Rubat Du Mérac; P. Jutier; J. Laurent; Bernard Courtois (Pattern Recognit. Lett., 1983)

Functional testing vs. structural testing of RAMs. - H. Sahami; Bernard Courtois (Fehlertolerierende Rechensysteme, 1984)

Principles of the SYCO compiler. - Ahmed Amine Jerraya; Patrick Varinot; Robert Jamier; Bernard Courtois (DAC, 1986)

Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. - J. Laurent; L. Bergher; Bernard Courtois; Jacques P. Collin (ITC, 1986)

Scanning the issue. - Bernard Courtois; Marco Mezzalama (Proc. IEEE, 1986)

UBIST version of the SYCO's control section compiler. - Kholdoun Torki; Michael Nicolaidis; Ahmed Amine Jerraya; Bernard Courtois (ICCD, 1988)

Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. - Jean Paul Caisso; Bernard Courtois (ITC, 1988)

Definition and Design of Strongly Language Disjoint Checkers. - Ingrid Jansch; Bernard Courtois (IEEE Trans. Computers, 1988)

Strongly Code Disjoint Checkers. - Michael Nicolaidis; Bernard Courtois (IEEE Trans. Computers, 1988)

A generalized theory of fail-safe systems. - Michael Nicolaidis; Serge Noraz; Bernard Courtois (FTCS, 1989)

Self-checking logic arrays. - Michael Nicolaidis; Bernard Courtois (Microprocess. Microsystems, 1989)

Random Pattern Testing Versus Deterministic Testing of RAM's. - René David; Antoine Fuentes; Bernard Courtois (IEEE Trans. Computers, 1989)

NAUTILE: a safe environment for silicon compilation. - Philippe Bondono; Ahmed Amine Jerraya; Armand Hornik; Bernard Courtois; D. Bonifas (EURO-DAC, 1990)

Robust tests for stuck-open faults and design for testability of reconvergent fan-out CMOS logic networks. - F. Darlay; Bernard Courtois (EURO-DAC, 1990)

Built-In Self-Test for Multi-Port RAMs. - Vladimir Castro Alves; Michael Nicolaidis; P. Lestrat; Bernard Courtois (ICCAD, 1991)

Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. - M. Marzouki; J. Laurent; Bernard Courtois (ITC, 1991)

Silicon compilation of hierarchical control sections with unified BIST testability. - Michael Nicolaidis; Kholdoun Torki; Ahmed Amine Jerraya; Bernard Courtois (Microprocess. Microsystems, 1991)

Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. - Sybille Hellebrand; Steffen Tarnick; Bernard Courtois; Janusz Rajski (ITC, 1992)

On the Design of Self-Checking Boundary Scannable Boards. - Marcelo Lubaszewski; Bernard Courtois (ITC, 1992)

Towards System level modeling and synthesis. - Ahmed Amine Jerraya; Kevin O'Brien; Inhag Park; Bernard Courtois (VLSI Design, 1992)

Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. - F. L. Vargas; Michael Nicolaidis; Bernard Courtois (ICCD, 1993)

Built-in self-test and fault diagnosis of fully differential analogue circuits. - Salvador Mir; Vladimir Kolarik; Marcelo Lubaszewski; C. Nielsen; Bernard Courtois (ICCAD, 1994)

Designing self-exercising analogue checkers. - Vladimir Kolarik; Marcelo Lubaszewski; Bernard Courtois (VTS, 1994)

Panel: New Research Problems in the Emerging Test Technology. - Vishwani D. Agrawal; Bernard Courtois; Fumiyasu Hirose; Sandip Kundu; Chung-Len Lee; Yinghua Min; Parimal Pal Chaudhuri (Asian Test Symposium, 1995)

Mixed-signal circuits and boards for high safety applications. - Marcelo Lubaszewski; Vladimir Kolarik; Salvador Mir; C. Nielsen; Bernard Courtois (ED&TC, 1995)

Frequency-based BIST for analog circuit testin. - Khaled Saab 001; Bozena Kaminska; Bernard Courtois; Marcelo Lubaszewski (VTS, 1995)

Conference Reports. - Sreejit Chakravarty; Ramalingam Sridhar; Shambhu J. Upadhyaya; Yervant Zorian; Gil Philips; Bozena Kaminska; Bernard Courtois (IEEE Des. Test Comput., 1995)

Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. - Sybille Hellebrand; Janusz Rajski; Steffen Tarnick; Srikanth Venkataraman; Bernard Courtois (IEEE Trans. Computers, 1995)

Analog checkers with absolute and relative tolerances. - Vladimir Kolarik; Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

Thermal Monitoring Of Safety-Critical Integrated Systems. - Vladimír Székely; Márta Rencz; Jean-Michel Karam; Marcelo Lubaszewski; Bernard Courtois (Asian Test Symposium, 1996)

High level CAD melds microsystems with foundries. - Jean-Michel Karam; Bernard Courtois; M. Bauge (ED&TC, 1996)

Applied design and analysis of microsystems. - Jean-Michel Karam; Bernard Courtois; András Poppe; Klaus Hofmann; Márta Rencz; Manfred Glesner; Vladimír Székely (ED&TC, 1996)

Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. - Salvador Mir; Bernard Courtois; Marcelo Lubaszewski; Vladimir Kolarik (ED&TC, 1996)

Second Therminic Workshop. - Bernard Courtois (IEEE Des. Test Comput., 1996)

Guest Editors' Introduction: Mixed Analog and Digital Systems. - Bozena Kaminska; Bernard Courtois (IEEE Des. Test Comput., 1996)

Guest editorial. - Bozena Kaminska; Bernard Courtois (J. Electron. Test., 1996)

Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. - Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1996)

Unified built-in self-test for fully differential analog circuits. - Salvador Mir; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1996)

CAD and Foundries for Microsystems. - Jean-Michel Karam; Bernard Courtois; Hicham Boutamine; P. Drake; András Poppe; Vladimír Székely; Márta Rencz; Klaus Hofmann; Manfred Glesner (DAC, 1997)

Generation of the HDL-A-model of a micromembrane from its finite-element-description. - Klaus Hofmann; Manfred Glesner; Nicu Sebe; Anca Manuela Manolescu; Santiago Marco; Josep Samitier; Jean-Michel Karam; Bernard Courtois (ED&TC, 1997)

Integrating on-chip temperature sensors into DfT schemes and BIST architectures. - Vladimír Székely; Márta Rencz; Bernard Courtois (VTS, 1997)

CAD Tools for Bridging Microsystems and Foundries. - Jean-Michel Karam; Bernard Courtois; Hicham Boutamine (IEEE Des. Test Comput., 1997)

Microsystems Testing: an Approach and Open Problems. - Marcelo Lubaszewski; Érika F. Cota; Bernard Courtois (DATE, 1998)

3D CMOS SOL for high performance computing. - Selim J. Abou-Samra; P. A. Aisa; Alain Guyot; Bernard Courtois (ISLPED, 1998)

Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. - A. Castillejo; D. Veychard; Salvador Mir; Jean-Michel Karam; Bernard Courtois (ITC, 1998)

Tracing the Thermal Behavior of ICs. - Vladimír Székely; Márta Rencz; Bernard Courtois (IEEE Des. Test Comput., 1998)

Thermal Monitoring of Self-Checking Systems. - Vladimír Székely; Márta Rencz; Jean-Michel Karam; Marcelo Lubaszewski; Bernard Courtois (J. Electron. Test., 1998)

A Reliable Fail-Safe System. - Marcelo Lubaszewski; Bernard Courtois (IEEE Trans. Computers, 1998)

Extending fault-based testing to microelectromechanical systems. - Salvador Mir; Benoît Charlot; Bernard Courtois (ETW, 1999)

Fault modeling of suspended thermal MEMS. - Benoît Charlot; Salvador Mir; Érika F. Cota; Marcelo Lubaszewski; Bernard Courtois (ITC, 1999)

Advanced Low Cost Manufacturing From CMP Service. - Kholdoun Torki; Bernard Courtois (MSE, 1999)

Design and Test of MEMs. - Bernard Courtois; Jean-Michel Karam; Salvador Mir; Marcelo Lubaszewski; Vladimír Székely; Márta Rencz; Klaus Hofmann; Manfred Glesner (VLSI Design, 1999)

Guest Editors' Introduction. - Bernard Courtois; R. D. (Shawn) Blanton (IEEE Des. Test Comput., 1999)

Towards design and validation of mixed-technology SOCs. - Salvador Mir; Benoît Charlot; Gabriela Nicolescu; Philippe Coste; Fabien Parrain; Nacer-Eddine Zergainoh; Bernard Courtois; Ahmed Amine Jerraya; Márta Rencz (ACM Great Lakes Symposium on VLSI, 2000)

IDDQ Testing of Submicron CMOS - by Cooling? - Márta Rencz; Vladimír Székely; S. Török; Kholdoun Torki; Bernard Courtois (J. Electron. Test., 2000)

Analog ALC crystal oscillators for high-temperature applications. - Raúl Andrés Bianchi; Jean-Michel Karam; Bernard Courtois (IEEE J. Solid State Circuits, 2000)

Design of self-checking fully differential circuits and boards. - Marcelo Lubaszewski; Salvador Mir; Vladimir Kolarik; C. Nielsen; Bernard Courtois (IEEE Trans. Very Large Scale Integr. Syst., 2000)

An Analog-based Approach for MEMS Testing. - Bernard Courtois; Salvador Mir; Benoît Charlot; Marcelo Lubaszewski (LATW, 2001)

CMP: The Access to Advanced Low Costy Manufacturing. - Kholdoun Torki; Bernard Courtois (MSE, 2001)

Electrically Induced Stimuli For MEMS Self-Test. - Benoît Charlot; Salvador Mir; Fabien Parrain; Bernard Courtois (VTS, 2001)

Generation of Electrically Induced Stimuli for MEMS Self-Test. - Benoît Charlot; Salvador Mir; Fabien Parrain; Bernard Courtois (J. Electron. Test., 2001)

Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. - Bernard Courtois (it Inf. Technol., 2003)

Infrastructures for Education, Research and Industry in Microelectronics - A review. - Bernard Courtois (DELTA, 2004)

On-chip testing of embedded silicon transducers. - Salvador Mir; Benoît Charlot; Libor Rufer; Bernard Courtois (SoCC, 2004)

On-chip testing of embedded transducers. - Salvador Mir; Libor Rufer; Bernard Courtois (VLSI Design, 2004)

Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. - Bernard Courtois (Microelectron. J., 2005)

Session Abstract. - Bernard Courtois (VTS, 2006)

Heterogeneous systems on chip and systems in package. - Ian O'Connor; Bernard Courtois; Krishnendu Chakrabarty; N. Delorme; M. Hampton; J. Hartung (DATE, 2007)

Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology - Péter G. Szabó; Balázs Németh; Márta Rencz; Bernard Courtois (CoRR, 2007)

European Nano Systems 2006. - Bernard Courtois (Microelectron. J., 2008)

Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. - Bernard Courtois; Kholdoun Torki; Sophie Dumont; Sylvaine Eyraud; Jean-François Paillotin; Gregory di Pendina (VLSI Design, 2009)

Microscale and Nanoscale Thermal Characterization of Integrated Circuit Chips. - Bernard Courtois; Ali Shakouri (VTS, 2009)

Special Session 8: New Topics: At-Speed Testing in the Face of Process Variations. - Bernard Courtois; Chandu Visweswariah (VTS, 2009)

European Nano Systems 2007. - Bernard Courtois (Microelectron. J., 2009)

ICs and MEMS for energy management. - Bernard Courtois (LATW, 2010)

Special section NANOTECH 2011. - Bernard Courtois (Microelectron. J., 2012)

Panel: the heritage of Mead & Conway: what has remained the same, what was missed, what has changed, what lies ahead. - Marco Casale-Rossi; Alberto L. Sangiovanni-Vincentelli; Luca P. Carloni; Bernard Courtois; Hugo De Man; Antun Domic; Jan M. Rabaey (DATE, 2013)

New topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond. - Bozena Kaminska; Bernard Courtois; Massimo Alioto (VTS, 2013)

New topic session 2B: Why (Re-)Designing Biology is ∗Slightly∗ more challenging than designing electronics. - Bozena Kaminska; Bernard Courtois; Soha Hassoun (VTS, 2013)

New topic session 2B: Co-design and reliability of power electronic modules - Current status and future challenges. - Bozena Kaminska; Bernard Courtois; Chris Bailey 001 (VTS, 2014)

New topic session 7B: Challenges and opportunities in test and design for test (DFT) of MEMS sensors. - Bozena Kaminska; Bernard Courtois; Mary Ann Maher (VTS, 2014)

Special Section NANOTECH 2013. - Bernard Courtois (Microelectron. J., 2014)

Special session on quantum systems: Next challenges in design, test, integration. - Carlo Reita; Jonathan Baugh; Gabriel Poulin-Lamarre; Bozena Kaminska; Bernard Courtois (VTS, 2018)

Special Session (New Topic): Emerging Computing and Testing Techniques. - Max M. Shulaker; Laurent Lebrun; Bozena Kaminska; Bernard Courtois (VTS, 2019)