Applications of the Thermal Step Method to the Characterization of Electric Charge in MOS Components. - Olivier Fruchier; Petru Notingher Jr.; Serge Agnel; Alain Toureille; F. Forest; S. Cunningham; Bernard Rousset; Jean-Louis Sanchez (IAS, 2007)

Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach. - Ludovic Boyer; Olivier Fruchier; Petru Notingher Jr.; Serge Agnel; Alain Toureille; Bernard Rousset; Jean-Louis Sanchez (IAS, 2008)

Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures. - Ludovic Boyer; Petru Notingher Jr.; Serge Agnel; Bernard Rousset; Jean-Louis Sanchez (IAS, 2010)