AC Test Quality: Beyond Transition Fault Coverage. - Yaron Aizenbud; Paul Chang; Moshe Leibowitz; Dave Smith; Bernd Könemann; Vijay S. Iyengar; Barry K. Rosen (ITC, 1992)

Delay Test: The Next Frontier for LSSD Test Systems. - Bernd Könemann; J. Barlow; Paul Chang; R. Gabrielson; C. Goertz; Brion L. Keller; Kevin McCauley; J. Tischer; Vijay S. Iyengar; Barry K. Rosen; T. Williams (ITC, 1992)

A Test Generation Methodology for High-Performance Computer Chips and Modules. - Bernd Könemann; Phil Noto (ITC, 1992)

Testable Programmable Digital Clock Pulse Control Elements. - Kenneth D. Wagner; Bernd Könemann (ITC, 1993)

Built-In Self-Test: Assuring System Integrity. - Bernd Könemann; Ben Bennetts; Najmi T. Jarwala; Benoit Nadeau-Dostie (Computer, 1996)

A SmartBIST Variant with Guaranteed Encoding. - Bernd Könemann; Carl Barnhart; Brion L. Keller; Thomas J. Snethen; Owen Farnsworth; Donald L. Wheater (Asian Test Symposium, 2001)

OPMISR: the foundation for compressed ATPG vectors. - Carl Barnhart; Vanessa Brunkhorst; Frank Distler; Owen Farnsworth; Brion L. Keller; Bernd Könemann; Andrej Ferko (ITC, 2001)

Extending OPMISR beyond 10x Scan Test Efficiency. - Carl Barnhart; Vanessa Brunkhorst; Frank Distler; Owen Farnsworth; Andrew Ferko; Brion L. Keller; David Scott; Bernd Könemann; Takeshi Onodera (IEEE Des. Test Comput., 2002)

Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities. - Bernd Könemann (ICCD, 2003)