On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model. - Bernhard Bauer 003; Mouadh Ayache; Saleh Mulhem; Meirav Nitzan; Jyotika Athavale; Rainer Buchty; Mladen Berekovic (Computer, 2022)

Trustworthy Integrated Circuits: From Safety to Security and Beyond. - Enkele Rama; Mouadh Ayache; Rainer Buchty; Bernhard Bauer 003; Matthias Korb; Mladen Berekovic; Saleh Mulhem (IEEE Access, 2024)