Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. - Hamid Toutah; Boubekeur Tala-Ighil; Jean-François Llibre; Bertrand Boudart; Taieb Mohammed-Brahim; Olivier Bonnaud (Microelectron. Reliab., 2003)

Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress. - Cheick Oumar Maïga; Hamid Toutah; Boubekeur Tala-Ighil; Bertrand Boudart (Microelectron. Reliab., 2004)

Hot carrier aging degradation phenomena in GaN based MESFETs. - Fabiana Rampazzo; Roberto Pierobon; D. Pacetta; Christophe Gaquière; Didier Théron; Bertrand Boudart; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2004)

Trench insulated gate bipolar transistors submitted to high temperature bias stress. - Cheick Oumar Maïga; Hamid Toutah; Boubekeur Tala-Ighil; Bertrand Boudart (Microelectron. Reliab., 2005)

Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N. - Yannick Guhel; Bertrand Boudart; E. Delos; Marianne Germain; Z. Bougrioua (Microelectron. Reliab., 2006)

Supercapacitor ageing at constant temperature and constant voltage and thermal shock. - Hamid Gualous; Roland Gallay; G. Alcicek; Boubekeur Tala-Ighil; Amrane Oukaour; Bertrand Boudart; Philippe Makany (Microelectron. Reliab., 2010)

Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature. - M. Tounsi; Amrane Oukaour; Boubekeur Tala-Ighil; Hamid Gualous; Bertrand Boudart; Djamil Aïssani (Microelectron. Reliab., 2010)

Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy. - Fanny Berthet; Yannick Guhel; Hamid Gualous; Bertrand Boudart; Jean-Lionel Trolet; Marc Piccione; Christophe Gaquière (Microelectron. Reliab., 2011)

Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. - Amrane Oukaour; Boubekeur Tala-Ighil; Bertrand Pouderoux; M. Tounsi; M. Bouarroudj-Berkani; Stéphane Lefebvre; Bertrand Boudart (Microelectron. Reliab., 2011)

Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour. - Boubekeur Tala-Ighil; Amrane Oukaour; Hamid Gualous; Bertrand Boudart; Bertrand Pouderoux; Jean-Lionel Trolet; Marc Piccione (Microelectron. Reliab., 2011)

Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence. - Fanny Berthet; Yannick Guhel; Hamid Gualous; Bertrand Boudart; Jean-Lionel Trolet; Marc Piccione; Christophe Gaquière (Microelectron. Reliab., 2012)

Calendar and cycling ageing of activated carbon supercapacitor for automotive application. - Hamid Gualous; Roland Gallay; Monzer Al Sakka; Amrane Oukaour; Boubekeur Tala-Ighil; Bertrand Boudart (Microelectron. Reliab., 2012)

Supercapacitors aging diagnosis using least square algorithm. - Amrane Oukaour; Mathieu Pouliquen; Boubekeur Tala-Ighil; Hamid Gualous; Eric Pigeon; Olivier Gehan; Bertrand Boudart (Microelectron. Reliab., 2013)

Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs. - Sébastien Petitdidier; Fanny Berthet; Yannick Guhel; Jean-Lionel Trolet; Philippe Mary; Christophe Gaquière; Bertrand Boudart (Microelectron. Reliab., 2015)