Reliability Investigation of Gallium Nitride HEMT. - A. Sozza; Christian Dua; Erwan Morvan; Bertrand Grimbert; V. Hoel; Sylvain L. Delage; N. Chaturvedi; Richard Lossy; Joachim Würfl (Microelectron. Reliab., 2004)

A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. - A. Sozza; Christian Dua; Erwan Morvan; Bertrand Grimbert; Sylvain L. Delage (Microelectron. Reliab., 2005)

High performance high reliability AlN/GaN DHFET. - Farid Medjdoub; Etienne Okada; Bertrand Grimbert; Damien Ducatteau; Riccardo Silvestri; Matteo Meneghini; Enrico Zanoni; Gaudenzio Meneghesso (ESSDERC, 2014)